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    Journals >Spectroscopy and Spectral Analysis >Volume 33 >Issue 1 >Page 275 > Article
    • Spectroscopy and Spectral Analysis
    • Vol. 33, Issue 1, 275 (2013)
    Determination of Optical Axis of Quartz wave Plate Based on Spectroscopic Ellipsometer
    ZHANG Bei-bei*, HAN Pei-gao, FU Shi-rong, ZHU Jiu-kai, and YAN Ke-zhu
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    DOI: 10.3964/j.issn.1000-0593(2013)01-0275-03 Cite this Article
    ZHANG Bei-bei, HAN Pei-gao, FU Shi-rong, ZHU Jiu-kai, YAN Ke-zhu. Determination of Optical Axis of Quartz wave Plate Based on Spectroscopic Ellipsometer[J]. Spectroscopy and Spectral Analysis, 2013, 33(1): 275 Copy Citation Text show less
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    ZHANG Bei-bei, HAN Pei-gao, FU Shi-rong, ZHU Jiu-kai, YAN Ke-zhu. Determination of Optical Axis of Quartz wave Plate Based on Spectroscopic Ellipsometer[J]. Spectroscopy and Spectral Analysis, 2013, 33(1): 275
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