• Opto-Electronic Engineering
  • Vol. 44, Issue 12, 1146 (2017)
Zixi Jia1, Song Huang1, Xiaorong Jin1, Ming Yang1, Zhandong Chen1、2, Jianghong Yao1, Qiang Wu1、*, and Jingjun Xu1
Author Affiliations
  • 1Key Laboratory of Weak-Light Nonlinear Photonics,Ministry of Education,TEDA Institute of Applied Physics and School of Physics,Nankai University,Tianjin 300457,China
  • 1Key Laboratory of Weak-Light Nonlinear Photonics,Ministry of Education,TEDA Institute of Applied Physics and School of Physics,Nankai University,Tianjin 300457,China:
  • 2Faculty of Science,Guangxi University for Nationalities,Nanning 530006, China
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    DOI: 10.3969/j.issn.1003-501x.2017.12.002.1 Cite this Article
    Zixi Jia, Song Huang, Xiaorong Jin, Ming Yang, Zhandong Chen, Jianghong Yao, Qiang Wu, Jingjun Xu. Research and development of femtosecond-laser hyperdoped silicon[J]. Opto-Electronic Engineering, 2017, 44(12): 1146 Copy Citation Text show less

    Abstract

    Femtosecond laser pulses induce intriguing transient photochemical reactions with semiconductors at the sample surface, due to its ultrashort duration and ultrahigh peak power. Taking advantage of these character-istics, material can be effectively doped. The doping level is likely far beyond the solid solubility limit (so called supersaturated doping), meanwhile quasi-periodic structures with micro/nano- scales are created at the material surface as well. As a result, surface properties are strikingly changed, e.g. ultra-high absorption over a broad range from near ultraviolet to infrared emerges, which breaks the limit of traditional physics and brings novel ap-plications. In this review, we summarize the basic theories and several physical models of femtosecond la-ser-silicon interaction, introduce its applications in relevant areas, and depict future prospects of femtosecond laser hyperdoped and processed silicon.
    Zixi Jia, Song Huang, Xiaorong Jin, Ming Yang, Zhandong Chen, Jianghong Yao, Qiang Wu, Jingjun Xu. Research and development of femtosecond-laser hyperdoped silicon[J]. Opto-Electronic Engineering, 2017, 44(12): 1146
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