• Spectroscopy and Spectral Analysis
  • Vol. 35, Issue 5, 1376 (2015)
SUN Yu-xiang1、2、*, ZHONG Shi-lei1、2, LU Yuan3, SUN Xin1、2, MA Jun-yan1、2, and LIU Zhe1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3964/j.issn.1000-0593(2015)05-1376-07 Cite this Article
    SUN Yu-xiang, ZHONG Shi-lei, LU Yuan, SUN Xin, MA Jun-yan, LIU Zhe. Application of LIBS in Element Analysis of Nanometer Thin Film Prepared on Silicon Basement[J]. Spectroscopy and Spectral Analysis, 2015, 35(5): 1376 Copy Citation Text show less
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    SUN Yu-xiang, ZHONG Shi-lei, LU Yuan, SUN Xin, MA Jun-yan, LIU Zhe. Application of LIBS in Element Analysis of Nanometer Thin Film Prepared on Silicon Basement[J]. Spectroscopy and Spectral Analysis, 2015, 35(5): 1376
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