• Laser & Optoelectronics Progress
  • Vol. 47, Issue 8, 81201 (2010)
Jiang Qin*, Qiu Lirong, Zhao Weiqian, and Sha Dingguo
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/lop47.081201 Cite this Article Set citation alerts
    Jiang Qin, Qiu Lirong, Zhao Weiqian, Sha Dingguo. Effect of Point Detector Position in Dual-Axes Confocal Microscopy[J]. Laser & Optoelectronics Progress, 2010, 47(8): 81201 Copy Citation Text show less

    Abstract

    The position of the point detector is one of the important parameters for the optical sectioning of the dual-axes confocal microscopy,so the point detector should be correctly positioned on the axis and without defocus. The effect of the point detector position in dual-axes confocal microscopy is analyzed. The results show that the slight axial offset of the point detector brings few effects on the axial intensity response,and a slight transverse offset of the point detector can introduce a shift into the axial response curve,while the main lobe of the axial response curve in shape is almost invariant,and the shift in the axis z increases as the offset increases.
    Jiang Qin, Qiu Lirong, Zhao Weiqian, Sha Dingguo. Effect of Point Detector Position in Dual-Axes Confocal Microscopy[J]. Laser & Optoelectronics Progress, 2010, 47(8): 81201
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