• Spectroscopy and Spectral Analysis
  • Vol. 36, Issue 12, 4039 (2016)
GAN Ting-ting1、2、*, ZHANG Yu-jun1, ZHAO Nan-jing1, YIN Gao-fang1, XIAO Xue1, ZHANG Wei3, LIU Jian-guo1, and LIU Wen-qing1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • show less
    DOI: 10.3964/j.issn.1000-0593(2016)12-4039-06 Cite this Article
    GAN Ting-ting, ZHANG Yu-jun, ZHAO Nan-jing, YIN Gao-fang, XIAO Xue, ZHANG Wei, LIU Jian-guo, LIU Wen-qing. Study of the Impact of Sample Thickness on Thin Film Method X-Ray Fluorescence Spectrum Measurement[J]. Spectroscopy and Spectral Analysis, 2016, 36(12): 4039 Copy Citation Text show less
    References

    [2] Kurunczi S, Trk Sz, Beal J W. Journal of Radioanalytical and Nuclear Chemistry, 2002, 253(2): 291.

    [3] YE Hua-jun, LIAO Xin-feng, GUO Sheng-liang, et al. Advanced Materials Research, 2012, 518-523: 1510.

    [5] Tsuji K, Nakano K, Takahashi Y, et al. Analytical Chemistry, 2012, 84(2): 636.

    [6] Radu T, Diamond D. Journal of Hazardous Materials, 2009, 171: 1168.

    [8] Bontempi E, Bertuzzi R, Ferretti E, et al. Microchimica Acta, 2008, 161: 301.

    [9] Malandrino M, Martino M D, Giacomino A, et al. Chemosphere, 2013, 90: 2578.

    [10] Kurunczi S, Torok S, Beal J W. X-Ray Spectrom, 1999, 28: 352.

    [11] Godelitsas A, Nastos P, Mertzimekis T J, et al. Nuclear Instruments and Methods in Physics Research B, 2011, 269: 3077.

    [12] Khodeir M, Shamy M, Alghamdi M, et al. Atmospheric Pollution Research, 2012, 3: 331.

    [13] PENG Yuan-zhen, HUANG Yong-ming, YUAN Dong-xing, et al. Chinese Journal of Analytical Chemistry, 2012, 40(6): 877.

    GAN Ting-ting, ZHANG Yu-jun, ZHAO Nan-jing, YIN Gao-fang, XIAO Xue, ZHANG Wei, LIU Jian-guo, LIU Wen-qing. Study of the Impact of Sample Thickness on Thin Film Method X-Ray Fluorescence Spectrum Measurement[J]. Spectroscopy and Spectral Analysis, 2016, 36(12): 4039
    Download Citation