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    Journals >Acta Optica Sinica >Volume 5 >Issue 4 >Page 310 > Article
    • Acta Optica Sinica
    • Vol. 5, Issue 4, 310 (1985)
    Raman speotroscopy of the silicide WSi2 formed by co-sputtered WSix
    SUN DIECHI1, YU ZENGQI1, LI FUMING1, and DU YUANCHENG2
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  • 1[in Chinese]
  • 2[in Chinese]
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    SUN DIECHI, YU ZENGQI, LI FUMING, DU YUANCHENG. Raman speotroscopy of the silicide WSi2 formed by co-sputtered WSix[J]. Acta Optica Sinica, 1985, 5(4): 310 Copy Citation Text show less

    Abstract

    Raman speotmm of the silicide "WSi2, which occurs at 333cm-1 and 456 cm-1, has been demonstrated. Formation of silicide from co-sputtered WSix was studied by Eaman speotroscopy.
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    SUN DIECHI, YU ZENGQI, LI FUMING, DU YUANCHENG. Raman speotroscopy of the silicide WSi2 formed by co-sputtered WSix[J]. Acta Optica Sinica, 1985, 5(4): 310
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    Paper Information
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