• Acta Optica Sinica
  • Vol. 25, Issue 2, 161 (2005)
[in Chinese]1、2、*, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, and [in Chinese]3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • show less
    DOI: Cite this Article Set citation alerts
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Determination of Surface Index of Graded-Index Waveguides[J]. Acta Optica Sinica, 2005, 25(2): 161 Copy Citation Text show less
    References

    [1] Ramaswamy R. Y., Srivastava R.. Ion-exchanged glass waveguides

    [2] White J. M., Heidrich P. F.. Optical waveguide refractive index profiles determined from measurement of mode indices: a simple analysis[J]. Appl. Opt., 1976, 15(1): 151~155

    [3] Chiang K. S., Wong C. L., Cheng S. Y. et al.. Refractive index profiling of graded-index waveguides from effective indexes measured with different external refractive indexes[J]. J. Lightwave Technol., 2000, 18(10): 1412~1417

    [4] Jirí Homola, Sinclair S. Yee, Günter Gauglitz. Surface plasma resonance sensors: review[J]. Sensors and Actuators (B), 1999, 54(1~2): 3~15

    [5] Cao Zhuangqi, Jiang Yi, Shen Qishen et al.. Exact analytical method for planar optical waveguides with arbitrary index profile[J]. J. Opt. Soc. Am. (A), 1999, 16(9): 2209~2212

    [8] Fukui M., Okuno Y., Shinya A. et al.. Studies on optical constants of metal films evaporated at low temperatures[J]. Surface Science, 1995, 323(3): 275~281

    [9] Chen W. P., Chen J. M.. Use of surface plasma waves for determination of the thickness and optical constants of thin metallic film[J]. J. Opt. Soc. Am., 1981, 71(2): 189~191

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Determination of Surface Index of Graded-Index Waveguides[J]. Acta Optica Sinica, 2005, 25(2): 161
    Download Citation