CAI Zhong-yi, CHEN Yun-xiang, CHE Fei, ZHANG Lei. Reliability Assessment of Nonlinear Accelerated Degradation Based on Wiener Process[J]. Electronics Optics & Control, 2016, 23(2): 87

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- Electronics Optics & Control
- Vol. 23, Issue 2, 87 (2016)
Abstract

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