Yeqi Zhang, Zhenfu Wang, Te Li, Lang Chen, Jiachen Zhang, Shunhua Wu, Jiachen Liu, Guowen Yang. Lifetime prediction method for high-power laser diodes under double-stress cross-step accelerated degradation test[J]. Infrared and Laser Engineering, 2023, 52(5): 20220592

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- Infrared and Laser Engineering
- Vol. 52, Issue 5, 20220592 (2023)
Abstract

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