Fig. 1. Schematic diagram of optical deflectometric system for sub-aperture stitching measurement

Fig. 2. Diagram of two sub-apertures and their overlapped region

Fig. 3. Surface data and its global position for various sub-apertures in simulation

Fig. 4. Stitched surfaces and residual errors in simulation. (a) Stitched surface with weighted-fusion method; (b) Nominal surface; (c) Residual error between (a) and (b); (d) Residual error between stitched surface based on mean calculation method and nominal surface

Fig. 5. Experimental setup of optical deflectometric system for sub-aperture stitching measurement

Fig. 6. Distorted fringes patterns acquired with CCD camera

Fig. 7. Measured surface and its global position for various sub-apertures in experiment

Fig. 8. Full-aperture measurement results and residual errors for a reflective lampshade in experiment. (a) Measurement result with weighted-fusion method; (b) Measurement result with a laser scanner; (c) Residual error between (a) and (b); (d) Residual error between measurement result stitched with mean calculation method and that with laser scanner