• Opto-Electronic Engineering
  • Vol. 34, Issue 9, 74 (2007)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Research of elliptical curved crystal analyzer for diagnostic X-ray spectrum[J]. Opto-Electronic Engineering, 2007, 34(9): 74 Copy Citation Text show less
    References

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    [7] Anderson S G,Heeter R F,Booth R,et al.Broadband high-resolution elliptical crystal x-ray spectrometer for high energy density physics experiments[J].Review of Scientific Instruments,2006,77(0631151):1-5.

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    [10] Fraenkel B S,Bitter M,yon Goeler S,et al.Focusing Properties of X-Ray Spectrometers with 2D-Curved Crystals for Extended X-Ray Sources of Hot Plasmas[J].Journal of X-Ray Science and Technology,1997(7):171-185.

    [11] Benjamin S Fraenkel,Mantled Bitter.The 2D curved crystal Johansson X-ray spectrometer for diagnostics of hot plasmas[J].Journal of X-Ray Science and Technology,2001(9):29-33.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Research of elliptical curved crystal analyzer for diagnostic X-ray spectrum[J]. Opto-Electronic Engineering, 2007, 34(9): 74
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