Infrared quantification calculation to inner wall defects at the corner of 3D spheroid

[in Chinese]

Journals >Infrared and Laser Engineering >Volume 32 >Issue 5 >Page 456 > Article

Infrared and Laser Engineering
Vol. 32, Issue 5, 456 (2003)

Infrared quantification calculation to inner wall defects at the corner of 3D spheroid

[in Chinese]^*

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[in Chinese]

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[in Chinese]. Infrared quantification calculation to inner wall defects at the corner of 3D spheroid[J]. Infrared and Laser Engineering, 2003, 32(5): 456 Copy Citation Text

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References

[9] Kassab J, Hsieh C K. Application of infrared scanners and inverse heat conduction methods to infrared computerized axial tomography[J]. Rev Sci Instrum, 1987,58(1): 89-95.

[in Chinese]. Infrared quantification calculation to inner wall defects at the corner of 3D spheroid[J]. Infrared and Laser Engineering, 2003, 32(5): 456

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