• Optics and Precision Engineering
  • Vol. 30, Issue 2, 160 (2022)
Yunfeng HE1, Dong WANG1,*, Zheng WANG1,2, Hainan GUAN1..., Bowei ZHANG1 and Dejie YAN1|Show fewer author(s)
Author Affiliations
  • 1Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun30033, China
  • 2Key Laboratory of Lunar and Deep Space Exploration, Chinese Academy of Sciences, Beijing100101, China
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    DOI: 10.37188/OPE.20223002.0160 Cite this Article
    Yunfeng HE, Dong WANG, Zheng WANG, Hainan GUAN, Bowei ZHANG, Dejie YAN. High reliability image storage electronics system of Tianwen-1 high-resolution camera[J]. Optics and Precision Engineering, 2022, 30(2): 160 Copy Citation Text show less
    Block diagram of Image storage electronics system
    Fig. 1. Block diagram of Image storage electronics system
    Block diagram of K9F8G08U0M
    Fig. 2. Block diagram of K9F8G08U0M
    NAND Flash four level pipeline programming operation
    Fig. 3. NAND Flash four level pipeline programming operation
    Image storage channel logical layer and physical layer mapping
    Fig. 4. Image storage channel logical layer and physical layer mapping
    Hamming calibration flow chart
    Fig. 5. Hamming calibration flow chart
    Image storage and processing electronics system of high resolution camera
    Fig. 6. Image storage and processing electronics system of high resolution camera
    Results of experimentation in the system
    Fig. 7. Results of experimentation in the system
    12×4 bit image 1 bit error correction Chipscope timing sequence
    Fig. 8. 12×4 bit image 1 bit error correction Chipscope timing sequence
    CCDH/kmVg/(km·s-1T/msfL/kHz
    全色2654.050.1238.1
    彩色2654.050.4922.03
    Table 1. Line period and line frequency of CCD detector
    数据1RP3RP2RP1RP0Bit11Bit10Bit9Bit8Bit7Bit6Bit5Bit4Bit3Bit2Bit1Bit0RP0RP2
    数据2CP3CP2CP1CP0Bit11Bit10Bit9Bit8Bit7Bit6Bit5Bit4Bit3Bit2Bit1Bit0RP1
    数据3CP7CP6CP5CP4Bit11Bit10Bit9Bit8Bit7Bit6Bit5Bit4Bit3Bit2Bit1Bit0RP0RP3
    数据40000Bit11Bit10Bit9Bit8Bit7Bit6Bit5Bit4Bit3Bit2Bit1Bit0RP1
    CP1CP0CP1CP0CP1CP0CP1CP0CP1CP0CP1CP0
    CP3CP2CP3CP2CP3CP2
    CP4CP5CP4
    CP7CP6
    Table 2. 12×4 bit row and line check table
    行号RP3~RP0 H
    15
    26
    39
    4A
    Table 3. Corresponding relationship between the row check code and row number when 1 bit error occurs
    列号CP7~CP0 H列号CP7~CP0 H
    155995
    2561096
    3591199
    45A129A
    56513A5
    66614A6
    76915A9
    86A16AA
    Table 4. Corresponding relationship between the column check code and column number when 1bit error occurs
    Yunfeng HE, Dong WANG, Zheng WANG, Hainan GUAN, Bowei ZHANG, Dejie YAN. High reliability image storage electronics system of Tianwen-1 high-resolution camera[J]. Optics and Precision Engineering, 2022, 30(2): 160
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