Yunfeng HE, Dong WANG, Zheng WANG, Hainan GUAN, Bowei ZHANG, Dejie YAN. High reliability image storage electronics system of Tianwen-1 high-resolution camera[J]. Optics and Precision Engineering, 2022, 30(2): 160

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- Optics and Precision Engineering
- Vol. 30, Issue 2, 160 (2022)

Fig. 1. Block diagram of Image storage electronics system

Fig. 2. Block diagram of K9F8G08U0M

Fig. 3. NAND Flash four level pipeline programming operation

Fig. 4. Image storage channel logical layer and physical layer mapping

Fig. 5. Hamming calibration flow chart

Fig. 6. Image storage and processing electronics system of high resolution camera

Fig. 7. Results of experimentation in the system

Fig. 8. 12×4 bit image 1 bit error correction Chipscope timing sequence
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Table 1. Line period and line frequency of CCD detector
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Table 2. 12×4 bit row and line check table
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Table 3. Corresponding relationship between the row check code and row number when 1 bit error occurs
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Table 4. Corresponding relationship between the column check code and column number when 1bit error occurs

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