• Optics and Precision Engineering
  • Vol. 30, Issue 2, 160 (2022)
Yunfeng HE1, Dong WANG1,*, Zheng WANG1,2, Hainan GUAN1..., Bowei ZHANG1 and Dejie YAN1|Show fewer author(s)
Author Affiliations
  • 1Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun30033, China
  • 2Key Laboratory of Lunar and Deep Space Exploration, Chinese Academy of Sciences, Beijing100101, China
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    DOI: 10.37188/OPE.20223002.0160 Cite this Article
    Yunfeng HE, Dong WANG, Zheng WANG, Hainan GUAN, Bowei ZHANG, Dejie YAN. High reliability image storage electronics system of Tianwen-1 high-resolution camera[J]. Optics and Precision Engineering, 2022, 30(2): 160 Copy Citation Text show less

    Abstract

    To solve the problem of low bandwidth between Mars and Earth and the high-output image data rate of the high-resolution camera of Tianwen-1, an electronic image-storage system was designed by using a NAND Flash as a storage medium and a FPGA as a control core. The NAND Flash was designed to use parallel processing and 4-level pipelining technology to meet the requirements of high data rate storage of camera images. To ensure the reliability of the image storage system, the storage system area was divided and a bad block replacement mechanism was established. Moreover, to avoid the influence of the original bit error rate and the single event radiation effect of space, a 12×4 bit Hamming verification was proposed. The experimental results showed that the designed electronic image-storage system could achieve the highest real-time image storage data rate of 1 276 Mbps on each single channel, reliable storage of image data, and 1 bit error correction for a 12×4 bit unit of image data, meeting the requirements of the space mission.
    Yunfeng HE, Dong WANG, Zheng WANG, Hainan GUAN, Bowei ZHANG, Dejie YAN. High reliability image storage electronics system of Tianwen-1 high-resolution camera[J]. Optics and Precision Engineering, 2022, 30(2): 160
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