• Opto-Electronic Engineering
  • Vol. 39, Issue 1, 88 (2012)
QUAN Hong-wei1、*, PENG Dong-liang2, and XUE An-ke2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2012.01.015 Cite this Article
    QUAN Hong-wei, PENG Dong-liang, XUE An-ke. Tracking Gate Technique for Joint Target State-class Probability Density[J]. Opto-Electronic Engineering, 2012, 39(1): 88 Copy Citation Text show less

    Abstract

    Most conventional tracking gate techniques only use the targets’ kinematic measurement information, which typically results in great uncertainties of measurement-to-track association for multi-target tracking in clutter. Considering that the target class information can be derived from attribute sensors, the tracking gate technique for joint target state-class probability density is proposed. Firstly, a joint probability density description of the target state and target class is given, by which the method for constructing the class-conditioned gates is developed. In order to comply with nonlinearity in practical application, evaluating of the gate threshold adopted an algorithm based on simulation. Scenario 1 shows that if the target predictive measurement density is skewed distribution, the simulation-based threshold-evaluating algorithm can achieve optimal gate volume; and scenario 2 presents a target tracking process for ground formation. Compared with the data association methods using traditional tracking gates, the class-conditioned gate technique significantly improves the probabilities of the measurement-to-track association.
    QUAN Hong-wei, PENG Dong-liang, XUE An-ke. Tracking Gate Technique for Joint Target State-class Probability Density[J]. Opto-Electronic Engineering, 2012, 39(1): 88
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