Growth, structure, and spectroscopic properties of Yb,Ho,Pr:GYTO single crystal （Invited）

Yi He; Renqin Dou; Haotian Zhang; Wenpeng Liu; Qingli Zhang; Yingying Chen; Yuxi Gao; Jianqiao Luo

doi:10.3788/IRLA20201067

Journals >Infrared and Laser Engineering >Volume 49 >Issue 12 >Page 20201067 > Article

Infrared and Laser Engineering
Vol. 49, Issue 12, 20201067 (2020)

Growth, structure, and spectroscopic properties of Yb,Ho,Pr:GYTO single crystal （Invited）

Yi He¹, Renqin Dou², Haotian Zhang¹, Wenpeng Liu², Qingli Zhang², Yingying Chen¹, Yuxi Gao¹, and Jianqiao Luo²

Author Affiliations

¹The Key Laboratory of Photonic Devices and Materials, Anhui Province, Anhui Institute of Optics and Fine Mechanics, Hefei institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, PR China

²The Key Laboratory of Photonic Devices and Materials, Anhui Province, Anhui Institute of Optics and Fine Mechanics, Hefei institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, PR China

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DOI: 10.3788/IRLA20201067 Cite this Article

Yi He, Renqin Dou, Haotian Zhang, Wenpeng Liu, Qingli Zhang, Yingying Chen, Yuxi Gao, Jianqiao Luo. Growth, structure, and spectroscopic properties of Yb,Ho,Pr:GYTO single crystal （Invited）[J]. Infrared and Laser Engineering, 2020, 49(12): 20201067 Copy Citation Text

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(a) Photograph of the as-grown Yb,Ho,Pr:GYTO crystal; (b) , , and -oriented wafers of Yb,Ho,Pr:GYTO crystal

Fig. 1. (a) Photograph of the as-grown Yb,Ho,Pr:GYTO crystal; (b) <100>, <010>, and <001>-oriented wafers of Yb,Ho,Pr:GYTO crystal

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Fig. 2. XRD patterns of Yb,Ho,Pr:GYTO single crystal

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Fig. 3. Rietveld refinement results from the XRD data of Yb,Ho,Pr:GYTO crystal

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Fig. 4. X-ray rocking curves of Yb,Ho,Pr:GYTO crystal

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Fig. 5. (a) Polarized absorption spectra of Yb,Ho,Pr:GYTO; (b) Comparization of Polarized absorption spectra of Yb,Ho,Pr:GYTO and Yb,Ho:GYTO in 850-1100 nm (a, b, c →Yb,Ho,Pr:GYTO; a’, b’, c’ →Yb,Ho:GYTO)

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Fig. 6. 2.9 μm emission spectrum of Yb,Ho,Pr:GYTO crystal

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Fig. 7. Fluorescence decay curves. (a) 1204 nm (⁵I₆→⁵I₈); (b) 2068 nm(⁵I₇→⁵I₈)

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Fig. 8. Schematic of energy transfer processes among Yb³⁺, Ho³⁺, and Pr³⁺ ions

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Atom	X	Y	Z	Wyckoff site	U_iso
Cell parameters: a=5.381 Å, b=11.023 Å, c=5.076 Å, β=95.59°; Cell volume: V=299.68 Å³; Space group: Monoclinic, I2/a (No.15); Density: ρ=8.630 g/cm³; Reliability factors(R-factor): Rp=9.72%, R_wp=7.21%
Gd	0.25	0.621000	0.0	4a	0.025
Y	0.25	0.621000	0.0	4a	0.025
Yb	0.25	0.621000	0.0	4a	0.025
Ho	0.25	0.621000	0.0	4a	0.025
Pr	0.25	0.621000	0.0	4a	0.025
Ta	0.25	0.145000	0.0	4a	0.025
O₁	0.094000	0.460000	0.254000	8c	0.025
O₂	−0.00700	0.717000	0.293000	8c	0.025

Table 1. Structural parameters obtained by Rietveld refinement

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Element	Starting material (at %)	Crystal (at %)	k_eff (C_s/C₀)
Yb	0.05	0.0312	0.624
Ho	0.01	0.0122	1.220
Pr	0.002	0.0027	1.350
Y	0.2	0.1953	0.977

Table 2. Effective segregation coefficients (k_eff) of Yb, Ho, Pr, and Y in Yb,Ho,Pr:GYTO crystal

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Crystals	Emission cross section (10⁻²⁰ cm²)
Yb,Ho,Pr:GYTO (this work)	14.4
Ho:GYTO^[25]	12.6
Yb,Ho:GYTO^[27]	18.9
Ho:LaF₃^[29]	0.63
Ho:LuLF^[30]	1.7
Ho:PbF₂^[31]	1.44

Table 3. Comparison of the emission cross section for 2.9 μm in the different Ho³⁺ doped crystals

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Crystal	Ho (⁵I₇)/ms	Ho (⁵I₆)/ μs
Yb,Ho:YSGG^[[32]]	10.2	585
Tm,Ho:YAG^[[33]]	11.4	40
Yb,Ho,Pr:YAP^[[24]]	1.258	341
Ho:GYTO^[[25]]	8.081	311
Tm,Ho:GYTO^[[26]]	4.09	131
Yb,Ho,Pr:GYTO (this work)	0.939	376

Table 4. Comparison of the lifetimes of ⁵I₇ and ⁵I₆ in different crystals

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