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Advanced Photonics Nexus
Vol. 2, Issue 5, 056008 (2023)

High-fidelity SIM reconstruction-based super-resolution quantitative FRET imaging

Zewei Luo^1,2,†, Guodong Zang^1,2, Ge Wu^1,2, Mengting Kong^1,2..., Zhengfei Zhuang^1,2 and Tongsheng Chen^1,2,*|Show fewer author(s)

Author Affiliations

¹South China Normal University, College of Biophotonics, MOE Key Laboratory of Laser Life Science, Guangzhou, China

²South China Normal University, College of Biophotonics, Guangdong Key Laboratory of Laser Life Science, Guangzhou, China

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DOI: 10.1117/1.APN.2.5.056008 Cite this Article Set citation alerts

Zewei Luo, Guodong Zang, Ge Wu, Mengting Kong, Zhengfei Zhuang, Tongsheng Chen, "High-fidelity SIM reconstruction-based super-resolution quantitative FRET imaging," Adv. Photon. Nexus 2, 056008 (2023) Copy Citation Text

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References

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Zewei Luo, Guodong Zang, Ge Wu, Mengting Kong, Zhengfei Zhuang, Tongsheng Chen, "High-fidelity SIM reconstruction-based super-resolution quantitative FRET imaging," Adv. Photon. Nexus 2, 056008 (2023)

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