• Acta Optica Sinica
  • Vol. 37, Issue 11, 1105001 (2017)
Feng Rong1、2、*, Ying Liang1, and Wei Xu1、2
Author Affiliations
  • 1 School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin 300387, China
  • 2 Tianjin Key Laboratory of Optoelectronic Detection Technology and System, Tianjin Polytechnic University, Tianjin 300387, China
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    DOI: 10.3788/AOS201737.1105001 Cite this Article Set citation alerts
    Feng Rong, Ying Liang, Wei Xu. Design of Dual Energy Analysis Grating[J]. Acta Optica Sinica, 2017, 37(11): 1105001 Copy Citation Text show less

    Abstract

    The dual energy X-ray grating phase contrast imaging system exhibits a variety of advantages, including high imaging efficiency, low radiation, setups without stepping device, and simple imaging platform. Under different energy levels of X-ray, the relationship between the CsI thickness and the fluorescence transmittance, and the relationship between the Bi thickness and the transmittance of X-ray are studied. Based on the above research, a dual energy analysis grating is designed. The grating structure and the fabrication materials of the gratings are described, and the calculation method of the thickness of the grating bar is analyzed. The simulation of dual energy analysis grating is carried out. The results show that the designed dual energy analysis grating can obtain clear fringe image, and it has good fringe contrast. The designed dual energy analysis grating is applied to dual energy X-ray grating phase contrast imaging system. With simulation, the imaging system can obtain the phase first order derivative image of the measured object, indicating that the designed dual energy analysis grating is valid.
    Feng Rong, Ying Liang, Wei Xu. Design of Dual Energy Analysis Grating[J]. Acta Optica Sinica, 2017, 37(11): 1105001
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