Echelle dif fraction grating based high-resolution spectrometer-on-chip on SiON waveguide platform

Xiao Ma; Jianjun He; Mingyu Li

doi:10.3788/col201311.032501

Journals >Chinese Optics Letters >Volume 11 >Issue 3 >Page 032501 > Article

Chinese Optics Letters
Vol. 11, Issue 3, 032501 (2013)

Echelle dif fraction grating based high-resolution spectrometer-on-chip on SiON waveguide platform

Xiao Ma, Jianjun He, and Mingyu Li

DOI: 10.3788/col201311.032501 Cite this Article Set citation alerts

Xiao Ma, Jianjun He, Mingyu Li. Echelle dif fraction grating based high-resolution spectrometer-on-chip on SiON waveguide platform[J]. Chinese Optics Letters, 2013, 11(3): 032501 Copy Citation Text

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Xiao Ma, Jianjun He, Mingyu Li. Echelle dif fraction grating based high-resolution spectrometer-on-chip on SiON waveguide platform[J]. Chinese Optics Letters, 2013, 11(3): 032501

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