Study on the Optical Properties of PbTiO3 Film Deposited on α-Al2O3 with RF-Sputtering System

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 21 >Issue 3 >Page 309 > Article

Acta Optica Sinica
Vol. 21, Issue 3, 309 (2001)

Study on the Optical Properties of PbTiO₃ Film Deposited on α-Al₂O₃ with RF-Sputtering System

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study on the Optical Properties of PbTiO₃ Film Deposited on α-Al₂O₃ with RF-Sputtering System[J]. Acta Optica Sinica, 2001, 21(3): 309 Copy Citation Text

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References

[1] Swanepoel R. Determination of the thickness and optical constants of amorphous silicon. J. Phys. E: Sci. Instrum., 1983, 16(12):1214～1222

[3] Macleod H A. Multiple determination of the optical constants of thin-film coating materials. Appl. Opt., 1984, 23(20):3571～3596

[4] Tauc JC.Optical properties of Soilds.Amsterdam:North Holland,1972.372

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study on the Optical Properties of PbTiO₃ Film Deposited on α-Al₂O₃ with RF-Sputtering System[J]. Acta Optica Sinica, 2001, 21(3): 309

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