• Opto-Electronic Engineering
  • Vol. 47, Issue 6, 190388 (2020)
Liao Qinkai1、2、*, Lin Shanling1、2, Lin Zhixian1、2, Chen Zheliang1、2, Li Tiantian1、2, and Tang Biao3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.12086/oee.2020.190388 Cite this Article
    Liao Qinkai, Lin Shanling, Lin Zhixian, Chen Zheliang, Li Tiantian, Tang Biao. Electrowetting defect image segmentation based on improved Otsu method[J]. Opto-Electronic Engineering, 2020, 47(6): 190388 Copy Citation Text show less

    Abstract

    Aiming at the effect of pixel defects on the display of electrowetting electronic paper, an automatic thre-shold detection method based on Otsu is proposed to detect defects. Otsu is a commonly used automatic threshold method that gives satisfactory results when the image histogram is bimodal. However, the electrowetting defect image histogram is usually a single peak, and Otsu method fails. Electrowetting differs from the background contrast due to the filling inks of different colors, making segmentation more difficult. In this paper, the weighting coefficient is introduced before the target variance, and the weight decreases as the cumulative probability of defects increases. The weight keeps a large value before the threshold crosses the peak, and the weight decreases after the peak, ensuring that the threshold is always to the left of the peak in the case of a single peak. The experimental results show that the proposed method can effectively segment the electrowetting defect region, especially in the electro-wetting defect image with lower contrast ratio. The method is closer to 0 compared to the ME value of Otsu, VE, WOV and entropy weighting methods. The proposed method has a better segmentation effect.
    Liao Qinkai, Lin Shanling, Lin Zhixian, Chen Zheliang, Li Tiantian, Tang Biao. Electrowetting defect image segmentation based on improved Otsu method[J]. Opto-Electronic Engineering, 2020, 47(6): 190388
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