[1] ERIC B F, LORI C B, TIMOTHY P S, et al. Three-wavelength electronic speckle pattern interferometry with the Fourier-transform method for simultaneous measurement of microstructure scale deformations in three dimensions[J]. Applied Optics, 2006, 45(14): 3218-322.
[2] SUN Ping, FAN Xiang-ju, WANG Xing-hai. Three-dimensional electronic speckle pattern interferometry with carrier modulation by using large-shearing block prism[J]. Acta Optica Sinica, 2011, 31(4): 0412012.
[7] LI Hong-ju, CHEN Hui-jun. Phase solution of modulated fringe carrier using wavelet transform[J]. Acta Scientiarum Naturalium Universitatis Pekinensis, 2007, 43(3): 317-320.
[10] LI Dong-qing, TAO Jun, WANG Li-hua, et al. Auto pick-up of fringe skeletons in ESPI displacement measurement[J]. Journal of Harbin Institute of Technology, 2003, 35(1): 46-48.
[11] WANG Hai-tao, LUO Qiu-feng, WAN Ming, et al. Extracting information of ESPI fringes based on fringe center method [J]. Journal of Nanjing University of Aeronautics & Astronautics, 2010, 42(1):107-111.
[13] SUN Ping, HUANG Zhen-xiang, LIU Fei. Shape measurement by carrier modulation in electronic speckle pattern interferometry[J]. Journal of Optoelectronics·Laser, 2008, 19(4): 525-527.
[14] WU Wei-ping, HE Yu-ming, HU Er-yi. Sub-pixel displacement analysis based on moving least-square cubic surface fitting alogorithm[J]. Chinese Journal of Solid Mechanics, 2008, 29(S1): 224-227.
[15] ZENG Qing-hong, LU De-tang. Curve and surface fitting based on moving least-squares methods[J]. Journal of Engineering Graphics, 2004, 25(1): 84-89.
[16] LI Er-tao, ZHANG Guo-xuan, ZENG Hong. Algorithm of surface fitting research based on least-squares methods[J]. Journal of Hangzhou Dianzi University, 2009, 29(2): 48-51.