Amelioration and precision improving of slit width measurement system based on the orthogonal linear CCD

[in Chinese]; [in Chinese]

Journals >Infrared and Laser Engineering >Volume 35 >Issue 1 >Page 75 > Article

Infrared and Laser Engineering
Vol. 35, Issue 1, 75 (2006)

Amelioration and precision improving of slit width measurement system based on the orthogonal linear CCD

[in Chinese]^* and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese]. Amelioration and precision improving of slit width measurement system based on the orthogonal linear CCD[J]. Infrared and Laser Engineering, 2006, 35(1): 75 Copy Citation Text

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[in Chinese], [in Chinese]. Amelioration and precision improving of slit width measurement system based on the orthogonal linear CCD[J]. Infrared and Laser Engineering, 2006, 35(1): 75

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