• Opto-Electronic Engineering
  • Vol. 35, Issue 10, 12 (2008)
PAN Yong-qiang1、2、*, WU Zhen-sen1, and HANG Ling-xia2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    PAN Yong-qiang, WU Zhen-sen, HANG Ling-xia. Light Scattering Properties of Multilayer Dielectric High-reflection Films[J]. Opto-Electronic Engineering, 2008, 35(10): 12 Copy Citation Text show less

    Abstract

    In order to study light scattering and reduce scattering losses from multilayer dielectric high-reflection films,vector scattering theory and relationship of total scattering losses based on vector scattering theory and Bidirectional Reflectance Distribution Function(BRDF)were concisely presented.Total scattering losses changing with incidence angle and polarization from dielectric high-reflection multilayer films in fully correlated and uncorrelated model were researched,respectively.Furthermore,the influence of incident wavelength on light total scattering losses was analyzed.The theoretical results show that total scattering losses of p-polarized scattered light due to p-polarized incident light(Spp) strongly depend on the correlation between interfaces of multilayer films,especially near the Brewster angle.Moreover,total scattering losses changing with wavelength are consistent well with reflection spectrum of high-reflection multilayer films at fully correlated model.The result is reverse to uncorrelated model.
    PAN Yong-qiang, WU Zhen-sen, HANG Ling-xia. Light Scattering Properties of Multilayer Dielectric High-reflection Films[J]. Opto-Electronic Engineering, 2008, 35(10): 12
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