• Infrared and Laser Engineering
  • Vol. 48, Issue 6, 603012 (2019)
Pan An1、2 and Yao Baoli1、3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3788/irla201948.0603012 Cite this Article
    Pan An, Yao Baoli. High-throughput and fast-speed Fourier ptychographic microscopy: A review[J]. Infrared and Laser Engineering, 2019, 48(6): 603012 Copy Citation Text show less

    Abstract

    Fourier ptychographic microscopy(FPM) is a promising label-free computational imaging technique with high resolution, wide field-of-view(FOV) and quantitative phase recovery. Due to its flexible setup, promising high-contrast performance without mechanical scanning and interferometric measurements, FPM has wide applications in the digital pathology, observation and dynamic imaging of label-free cells in vitro. In this review, the principle, research status and the latest advances were introduced in several aspects of FPM such as the system calibration methods, high-throughput imaging and high-speed imaging. The current problems and future trends were also presented.
    Pan An, Yao Baoli. High-throughput and fast-speed Fourier ptychographic microscopy: A review[J]. Infrared and Laser Engineering, 2019, 48(6): 603012
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