• Infrared and Laser Engineering
  • Vol. 47, Issue 5, 523001 (2018)
Huang Linsheng1、*, Zhang Qing1, Zhang Dongyan1, Lin Fenfang2, Xu Chao1, and Zhao Jinling1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/irla201847.0523001 Cite this Article
    Huang Linsheng, Zhang Qing, Zhang Dongyan, Lin Fenfang, Xu Chao, Zhao Jinling. Early diagnosis of wheat powdery mildew based on Relief-F band screening[J]. Infrared and Laser Engineering, 2018, 47(5): 523001 Copy Citation Text show less
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    [9] Liang Dong, Yang Qinying, Huang Wenjiang, et al. Estimation of leaf area index based on wavelet transform and support vector machine regression in winter wheat[J]. Infrared and Laser Engineering, 2015, 44(1): 335-340. (in Chinese)

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    Huang Linsheng, Zhang Qing, Zhang Dongyan, Lin Fenfang, Xu Chao, Zhao Jinling. Early diagnosis of wheat powdery mildew based on Relief-F band screening[J]. Infrared and Laser Engineering, 2018, 47(5): 523001
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