• Laser & Optoelectronics Progress
  • Vol. 51, Issue 5, 53001 (2014)
Bai Xin1、*, Wu Haiying2, Li Yan1, and Guo Xiaohong1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop51.053001 Cite this Article Set citation alerts
    Bai Xin, Wu Haiying, Li Yan, Guo Xiaohong. Transmission Ratio of Glan-Taylor Prism in Polarization Interference Imaging Spectrometer[J]. Laser & Optoelectronics Progress, 2014, 51(5): 53001 Copy Citation Text show less
    References

    [1] Rafert J B, Sellar R G, Blatt J H. Monolithic Fourier transform imaging spectrometer [J]. Appl Opt, 1995, 34(31): 7228-7230.

    [2] Hammer P D, Valero F P J, Peterson D L. An imaging interferometer for terrestrial romote sensing [C]. SPIE, 1993,1937: 244-255.

    [3] Wu Haiying, Zhang Chunmin, Zhao Baochang. Analysis and evaluation of Glan-Taylor prism′s image quality in a view polarization interference imaging spectrometer [J]. Acta Physica Sinica, 2008, 57(6): 3499-3505.

    [4] Zhang Chunmin, Liu Ning, Wu Fuquan. The analysis and calculation of Glan-Taylor prism′s transmittance at full angle of view in a polarization interference imaging spectrometer [J]. Acta Physica Sinica, 2010, 59(2): 949-956.

    [5] Shen Weimin, Shao Zhongxing. Dispersion between ordinary ray and extraordinary ray in uniaxial crystals for any orientation of optical axis [J]. Acta Optica Sinica, 2002, 22(6): 765-768.

    [6] Zhao Tingsheng, Li Guohua, Peng Handong, et al.. Modified Glan- Taylor prisms and its characteristics [J]. Chinese J Lasers, 2007, 34(10): 1383-1387.

    [7] Shi Meng, Wu Fuquan, Fan Jiyang. Effect of the air gap thickness on the intensity perturbance of transmitted light for the Taylor prism [J]. Optics & Optoelectronic Technology, 2005, 3(4): 50-53.

    [8] Liu Caiming. Refraction regularity of extraordinary ray in uniaxial crystal with arbitrarily orienter optical axis [J]. Optical Technique, 2002, 28(6): 559-563.

    Bai Xin, Wu Haiying, Li Yan, Guo Xiaohong. Transmission Ratio of Glan-Taylor Prism in Polarization Interference Imaging Spectrometer[J]. Laser & Optoelectronics Progress, 2014, 51(5): 53001
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