[1] Sun X G, Yuan G B, Dai J M, et al. International Journal of Thermophysics, 2005, 26(4): 1255.

[2] Xing J, Rana R S, Gu W. Optics Express, 2016, 24(17): 19185.

[3] Daniel K, Feng C, Gao S. Measurement, 2016, 92: 218.

[4] Gao S, Wang L X, Feng C, et al. Optical Review, 2015, 22(4): 605.

[5] Fu T R, Zhao H A, Zeng J, et al. Applied Optics, 2010, 49(31): 5997.

[6] Fu T R, Cheng X F, Fan X L, et al. Metrologia, 2004, 41(4): 305.

[7] Hunter G B, Allemand C D, Eagar T W. Proceedings of the Society of Photo-Optical Instrumentation Engineers, 1985, 520: 40.

[8] Zhang X Y, Cheng Q A, Lou C, et al. Proceedings of the Combustion Institute, 2011, 33: 2755.

[9] Li, W H, Lou C, Sun Y P, et al. Experimental Thermal and Fluid Science, 2011, 35(2): 416.

[11] Coates P B. Metrologia, 1981, 17(3): 103.

[12] Moore A S, Benstead J, Ahmed M F, et al. Review of Scientific Instruments, 2016, 87(11): 11E313.

[13] Madura H, Piatkowski T. Infrared Physics & Technology, 2004, 46(1-2): 185.

[14] Tapetado A, Díazálvarez J, Miguélez M H, et al. Journal of Lightwave Technology, 2016, 34(4): 1380.

[15] Khatibi P D, Henein H. Materialwissenschaft Und Werkstofftechnik, 2014, 45(8): 736.

[16] Muller B, Renz U. Review of Scientific Instruments, 2001, 72(8): 3366.

[17] Thevenet J, Siroux M, Desmet B. Applied Thermal Engineering, 2010, 30(6): 753.