Error Analysis of Ring Source Based on ZEMAX Interferometer Model

XU Yan; WU Yongqian; LI Shifang; WAN Yongjian; HOU Xi

doi:10.3969/j.issn.1003-501x.2015.02.014

Journals >Opto-Electronic Engineering >Volume 42 >Issue 2 >Page 84 > Article

Opto-Electronic Engineering
Vol. 42, Issue 2, 84 (2015)

Error Analysis of Ring Source Based on ZEMAX Interferometer Model

XU Yan^*, WU Yongqian, LI Shifang, WAN Yongjian, and HOU Xi

Author Affiliations

[in Chinese]

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DOI: 10.3969/j.issn.1003-501x.2015.02.014 Cite this Article

XU Yan, WU Yongqian, LI Shifang, WAN Yongjian, HOU Xi. Error Analysis of Ring Source Based on ZEMAX Interferometer Model[J]. Opto-Electronic Engineering, 2015, 42(2): 84 Copy Citation Text

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References

[1] Kuechel M. Apparatus and method(s) for reducing the effect of coherent artifacts in an interferometer: U.S, 6804011 [P]. 2002-01-22.

[2] Deck LL, Stephenson D, Gratix E, et al. Apparatus and method(s) for reducing the effect of coherent artifacts in an interferometer: U.S, 6643024 [P]. 2001.

[3] Deck L L. Interferometric methods and systems using low coherence illumination: US, 6028670 [P]. 2000.

[4] Michael Kuchel. Spatial coherence in interferometry [EB/OL]. (2004). www.zygo.com.

[5] CAO Xiaojun, ZHU Jianqiang, LIN Qiang. Interference characteristic analysis on RoF illumination [J]. Proceeding of SPIE(S0277-786X), 2006, 6034: 60341Q-7.

[6] XU Jiancheng, XU Qiao, DENG Yan, et al. Application of ring soure in interferometer [J]. High Power Laser and Particle Beams, 2008, 20(3): 367-370.

[7] XU Yan, WAN Yongjian, WU Yongqian, et al. Ring source technology based on spatial coherence control [J]. High Power Laser and Particle Beams, 2011, 23(12): 3245-3250.

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[1] Linhua Gao, Yanxia Cui, Qiangbing Liang, Yanzhen Liu, Guohui Li, Mingming Fan, Yuying Hao. Research progress in metal-inorganic semiconductor-metal photodetectors[J]. Infrared and Laser Engineering, 2020, 49(8): 20201025

XU Yan, WU Yongqian, LI Shifang, WAN Yongjian, HOU Xi. Error Analysis of Ring Source Based on ZEMAX Interferometer Model[J]. Opto-Electronic Engineering, 2015, 42(2): 84

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