A Post Filtering Method Based on Generalized Analysis Model for Digital Fringe Pattern Profilometry

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

[1] M. Takeda, Hideki Ina, S. Kobayashi. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry[J]. J. Opt. Soc. Am. A, 1982, 72(1): 156～160

[2] M. Takeda, K. Mutoh. Fourier transform profilometry for the automatic measurement of 3-D object shapes[J]. Appl. Opt., 1983, 22(24): 3977～3982

[6] V. Srinivasan, H. C. Liu, M. Halioua. Automated phase-measuring profilometry of 3-D diffuse objects[J]. Appl. Opt., 1984, 23(18): 3105～3108

[11] S. Toyooka, Y. Iwaasa. Automatic profilometry of 3-D diffuse objects by spatial phase detection[J]. Appl. Opt., 1986, 25(10): 1630～1633

[12] M. R. Sajan, C. J. Tay, H. M. Shang et al.. Improved spatial phase detection for profilometry using a TDI imager[J]. Opt. Commun., 1998, 150(1～6): 66～70

[13] M. A. Gdeisat, D. R. Burton, M. J. Lalor. Fringe pattern demodulation with a two-frame digital phase-locked loop algorithm[J]. Appl. Opt., 2002, 41(26): 5471～5478

[14] M. A. Gdeisat, D. R. Burton, M. J. Lalor. Fringe pattern demodulation with a two-dimensional digital phase-locked loop algorithm[J]. Appl. Opt., 2002, 41(26): 5479～5487

[15] D. M. Meadows, W. Johnson, J. B. Allen. Generation of surface contours by moire patterns[J]. Appl. Opt., 1970, 9(4): 942～947

[17] A. J. Moore, F. Mendoza-Santoyo. Phase demodulation in the space domain without a fringe carrier[J]. Opt. and Lasers in Engng., 1995, 23(5): 319～330

[18] J. Villa, M. Servin, L. Castillo. Profilometry for the measurement of 3-D object shapes based on regularized filters[J]. Opt. Commun., 1999, 161(1～3): 13～18

[19] Hongwei Guo, Haitao He, Mingyi Chen. Gamma correction for digital fringe projection profilometry[J]. Appl. Opt., 2004, 43(14): 2906～2914

[20] Yingsong Hu, Jiangtao Xi, Enbang Li et al.. Three-dimensional profilometry based on shift estimation of projected fringe patterns[J]. Appl. Opt., 2006, 45(4): 678～687

[21] L. Biancardi, G. Sansoni, F. Docchio. Adaptive whole-field optical profilometry: a study of the systematic errors[J]. IEEE Trans. Instrum. and Measure., 1995, 44(1): 36～41

[22] Zhou J, Liang Z. Several factors impairing the phase measurement accuracy[J]. Opt. and Lasers in Engng., 1995, 23(4): 199～212