• Infrared and Laser Engineering
  • Vol. 48, Issue 2, 204004 (2019)
Wang Zijun*, Qiu Yanrui, Yang Hongxiao, and Sun Lei
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/irla201948.0204004 Cite this Article
    Wang Zijun, Qiu Yanrui, Yang Hongxiao, Sun Lei. Algorithm for defect segmentation in infrared nondestructive testing based on robust Otsu[J]. Infrared and Laser Engineering, 2019, 48(2): 204004 Copy Citation Text show less
    References

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    Wang Zijun, Qiu Yanrui, Yang Hongxiao, Sun Lei. Algorithm for defect segmentation in infrared nondestructive testing based on robust Otsu[J]. Infrared and Laser Engineering, 2019, 48(2): 204004
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