Goos-Hnchen (GH) shifts of reflected and transmitted wave beams in frustrated total reflection structure occur simultaneously. Commonly, GH shift of frustrated-total-reflection in symmetric double-prism configuration is only of the order of the wavelength. It's difficult to measure it in experiment. According to Maxwell equations, the complex expressons of reflection coefficient and transmission coefficient are presented when the incident angle is less than the critical angle of prism-film interface but larger than the critical angle of prism-air interface in the thin-film enhanced frustrated total reflection configuration. The GH shifts of reflected and transmitted wave beams are investigated by stationary-phase approach. The results show that the GH shifts of reflected and transmitted wave beams are equal and can be modulated by changing the incident angle and thickness of thin film and air gap. When the incident angle is less than, but close to the critical angle of prism-film interface, the magnitude of the shifts is enhanced by a factor of 102 with given thickness of thin film and air gap.