• Opto-Electronic Engineering
  • Vol. 34, Issue 9, 78 (2007)
[in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Discussion of the level of discrete wavelet guided by the ridge of wavelet[J]. Opto-Electronic Engineering, 2007, 34(9): 78 Copy Citation Text show less
    References

    [1] Takeda M,Mutoh K.Fourier transform profilometry for the automatic measurement of 3-D object shapes[J].Appl.Opt,1983,22:3977-3982.

    [5] ZHONG Jin-gang,WENG Jia-wen.Phase retrieval of optical fringe patterns from the ridge of a wavelet transform[J].Opt.Lett,2005,30:2560-2562.

    [6] Afifi M,Fassi-Fihri A,Marjane M,et al.Rachafi.Paul wavelet-based algorithm for optical phase distribution evaluation[J].Opt.Commun,2002,211:47-51.

    [7] Gorthi S S,Lolla K R.Wavelet Transform Analysis of Truncated Fringe Patterns in 3-D Surface Profilometry[J].SPIE,2005,5856:265-273.

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    [2] SHEN Hui-yan, ZHOU Pu-cheng. Polarization Imagery Fusion Method Based on Human Visual Characteristic[J]. Opto-Electronic Engineering, 2010, 37(8): 76

    [in Chinese], [in Chinese], [in Chinese]. Discussion of the level of discrete wavelet guided by the ridge of wavelet[J]. Opto-Electronic Engineering, 2007, 34(9): 78
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