• Acta Photonica Sinica
  • Vol. 51, Issue 4, 0412003 (2022)
Jun LONG1、2, Ping CAI1、2、*, Shuyuan PAN1、2, Chiyue LIU1、2, and Hao YAN1、2
Author Affiliations
  • 1School of Electronic Information and Electrical Engineering,Shanghai Jiao Tong University,Shanghai 200240,China
  • 2Shanghai Engineering Research Center for Intelligent Diagnosis and Treatment Instrument,Shanghai 200240,China
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    DOI: 10.3788/gzxb20225104.0412003 Cite this Article
    Jun LONG, Ping CAI, Shuyuan PAN, Chiyue LIU, Hao YAN. Phase Stitching Based Multi-CCDs Deformation Measurement in Digital Speckle Pattern Interferometry[J]. Acta Photonica Sinica, 2022, 51(4): 0412003 Copy Citation Text show less
    Multi-CCD DSPI experimental setup
    Fig. 1. Multi-CCD DSPI experimental setup
    The flow chart of proposed method of phase stitching
    Fig. 2. The flow chart of proposed method of phase stitching
    Experiment setup
    Fig. 3. Experiment setup
    The relationship between the standard deviation of the difference of before and after stitching and size of overlapping area
    Fig. 4. The relationship between the standard deviation of the difference of before and after stitching and size of overlapping area
    Unwrapped phase map and the relative errors of the overlapping area before and after stitching
    Fig. 5. Unwrapped phase map and the relative errors of the overlapping area before and after stitching
    Least square fitting and fitting residuals
    Fig. 6. Least square fitting and fitting residuals
    Measuring methodCCD#1CCD#2Stitched
    R1.000 01.000 01.000 0
    RMSE /μm0.0150.0120.010
    Table 1. The RMSE and R of the measurement results
    Jun LONG, Ping CAI, Shuyuan PAN, Chiyue LIU, Hao YAN. Phase Stitching Based Multi-CCDs Deformation Measurement in Digital Speckle Pattern Interferometry[J]. Acta Photonica Sinica, 2022, 51(4): 0412003
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