• Infrared and Laser Engineering
  • Vol. 51, Issue 6, 20210517 (2022)
Jie Wang, Chongliang Zhong, and Weidong Zhu*
Author Affiliations
  • School of Mechanical Engineering, Zhejiang University, Hangzhou 310027, China
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    DOI: 10.3788/IRLA20210517 Cite this Article
    Jie Wang, Chongliang Zhong, Weidong Zhu. A near-infrared binocular system for optical instrument tracking[J]. Infrared and Laser Engineering, 2022, 51(6): 20210517 Copy Citation Text show less
    Sensor test
    Fig. 1. Sensor test
    Sensor acquisition
    Fig. 2. Sensor acquisition
    System principle framework
    Fig. 3. System principle framework
    Marking instrument
    Fig. 4. Marking instrument
    (a) Contour error extraction; (b) Correct contour extraction
    Fig. 5. (a) Contour error extraction; (b) Correct contour extraction
    Plane fitting
    Fig. 6. Plane fitting
    (a) Symmetric subset; (b) Asymmetric subset
    Fig. 7. (a) Symmetric subset; (b) Asymmetric subset
    (a) Mutual position; (b) Instrument marking sequence
    Fig. 8. (a) Mutual position; (b) Instrument marking sequence
    (a) Multiple instruments identification; (b) Add interference
    Fig. 9. (a) Multiple instruments identification; (b) Add interference
    Tip rotation test
    Fig. 10. Tip rotation test
    ThresholdNumber
    0.4008
    0.3007
    0.2267
    0.2256
    0.2246
    0.2006
    0.1006
    Table 1. tr threshold selection
    ThresholdNumber
    0.0124
    0.0114
    0.0103
    0.0093
    0.0083
    Table 2. ts threshold selection
    ${{{L_1}} \mathord{\left/ {\vphantom {{{L_1}} {{L_2}}}} \right. } {{L_2}}}$${{{L_3}} \mathord{\left/ {\vphantom {{{L_3}} {{L_4}}}} \right. } {{L_4}}}$Types of devices
    > 1> 1A
    < 1< 1B
    > 1< 1C
    Table 3. Types of instruments
    Number of instrumentsFour interfering light sourcesNo interfering light sources
    143
    24.23.5
    34.54
    Table 4. Time required for multiple instruments identification (Unit:ms)
    Position5 mm10 mm15 mm20 mm
    15.108710.310415.510020.5739
    26.313610.634815.760820.8322
    35.106010.092615.126820.3387
    46.428212.494418.397523.2675
    55.292310.499415.638020.8859
    66.082311.619816.855222.4211
    RMSE0.61950.92521.21601.1768
    MAE0.55280.74350.94110.9718
    Table 5. Positioning accuracy test(Unit:mm)
    DistanceTrue valueMax errorRMSEMAE
    D1670.50.40720.61840.5254
    D1470.70.17200.52050.4097
    D241001.06540.57650.4619
    Table 6. Dynamic tracking verification (Unit:mm)
    Jie Wang, Chongliang Zhong, Weidong Zhu. A near-infrared binocular system for optical instrument tracking[J]. Infrared and Laser Engineering, 2022, 51(6): 20210517
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