• Infrared and Laser Engineering
  • Vol. 36, Issue 2, 186 (2007)
[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Feature extraction and recognition of laser speckle for special material surface[J]. Infrared and Laser Engineering, 2007, 36(2): 186 Copy Citation Text show less
    References

    [1] LIU Chnn-tian,XU You-ren,XU Yuan.Experimental investigation on the statistical properties of speckle recorded by a CCD camera[C]//Proceeding of SPIE,International Conference on Holography and Optical Information Processing (ICHOIP '96),1996,2866:374-377.

    [2] YAMAGUCHI Ichirou,KOBAYASHI Koichi,YAROSLAVSKY Leonid.Measurement of surface roughness by speckle correlation[J].Optical Engineering,2004,43:2753-2761.

    [3] SUN Yin-long.Statistically based reflection model for rough surfaces[J].Proceedings of SPIE,Computational Imaging,2003,5016:91-102.

    [4] RINDER T,ROTHE H.Characterisation of Surfaces Using Neural Pattern Recognition Methods Based on BRDF and AFM Measurements[C]// Proceedings of SPIE,Rough Surface Scattering and Contamination,1999,3784:132-146.

    [5] GU Zu-han,DUMMER R S,MCKENNA P,et al.Giant Enhanced Backscattering in Laser Ladar Signatrues[C]//Proceedings of SPIE,Industrial Applications of Laser Radar,1994,2271:97-180.

    [6] MALLAT S G.A Theory for Multiresolution signal decomposition[J].IEEE Trans on PAMI,1989,11(7):674-693.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Feature extraction and recognition of laser speckle for special material surface[J]. Infrared and Laser Engineering, 2007, 36(2): 186
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