Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view

Guiyun Li; Liyuan Gu; Jingpei Hu; Linglin Zhu; Aijun Zeng; Huijie Huang

doi:10.3788/COL201917.011201

Journals >Chinese Optics Letters >Volume 17 >Issue 1 >Page 011201 > Article

Chinese Optics Letters
Vol. 17, Issue 1, 011201 (2019)

Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view

Guiyun Li^1、2, Liyuan Gu^1、2, Jingpei Hu¹, Linglin Zhu¹, Aijun Zeng^1、2、*, and Huijie Huang^1、2

Author Affiliations

¹Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²University of Chinese Academy of Sciences, Beijing 100049, China

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DOI: 10.3788/COL201917.011201 Cite this Article Set citation alerts

Guiyun Li, Liyuan Gu, Jingpei Hu, Linglin Zhu, Aijun Zeng, Huijie Huang. Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view[J]. Chinese Optics Letters, 2019, 17(1): 011201 Copy Citation Text

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