Interferometric measurement of near-cylindrical surfaces

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Infrared and Laser Engineering >Volume 34 >Issue 1 >Page 54 > Article

Infrared and Laser Engineering
Vol. 34, Issue 1, 54 (2005)

Interferometric measurement of near-cylindrical surfaces

[in Chinese]^1、2、*, [in Chinese]¹, [in Chinese]¹, and [in Chinese]¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

show less

DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Interferometric measurement of near-cylindrical surfaces[J]. Infrared and Laser Engineering, 2005, 34(1): 54 Copy Citation Text

show less

References

[1] Patrick L Thompson,James E Harvey.The‘aplanatic'wolter type I telescope design:is there a practical advantage [A].SPIE[C].1998, 3444.526-542.

[2] Glatzel H,Schmid M,Egle W,et al.Assembly,performance prediction and X-ray test of the demonstration model ODM for the Xray telescope XMM [A].SPIE[C].1994,2210.360-372.

[3] Geary J M. Interferometry on grazing incidence optics [J]. Optical Engineering,1987 ,26(12):1125-1128 .

[4] Geary J M. Interferometry on Wolter X-ray optics:a possible approach[J]. Optical Engineering,1989,28(3): 217-221.

[6] Alfred Gatzweiler, Holger Glatzel. Interferometric measurement of near-cylindrical surfaces with high amplitude resolution[J].Applied optics, 1995, 34(31):7207-7212.

[7] Geary J M.New test for cylindrical optics[J].Optical Engineering, 1987, 26(8):813-820.

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Interferometric measurement of near-cylindrical surfaces[J]. Infrared and Laser Engineering, 2005, 34(1): 54

Download Citation

Tools

Save the article for my favorites

Paper Information