• Infrared and Laser Engineering
  • Vol. 34, Issue 1, 54 (2005)
[in Chinese]1、2、*, [in Chinese]1, [in Chinese]1, and [in Chinese]1
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  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Interferometric measurement of near-cylindrical surfaces[J]. Infrared and Laser Engineering, 2005, 34(1): 54 Copy Citation Text show less

    Abstract

    In this paper,the testing set for near-cylindrical surfaces is simulated by computer.The interferograms under ideal near-cylindrical surfaces and ideal cylindrical lens are got and analyzed. The method to reduce P-V value of the interferograms and the testability of all kinds of near-cylindrical surfaces under the testing set are discussed.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Interferometric measurement of near-cylindrical surfaces[J]. Infrared and Laser Engineering, 2005, 34(1): 54
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