• Opto-Electronic Engineering
  • Vol. 33, Issue 10, 96 (2006)
[in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Extended dynamic-range techniques of CCD measurements[J]. Opto-Electronic Engineering, 2006, 33(10): 96 Copy Citation Text show less
    References

    [1] G.GONZALEZ-MORENO,J.A.QUIROGA,J.ALONSO,et al.Laser beam profiling with extended image range techniques[J].Optical Engineering,2005,44(2):023602.

    [3] Mark A.ROBERTSON,Sean BORMAN,Robert L.STEVENSON.Dynamic range improve through multiple exposure[A].Proceedings 1999 International Conference on Image Processing[C].Chicago:IEEE,1999.159-163.

    [5] GONZALEZ R.C,WOODS R E.Digital Image Processing[M].New Jersey:Prentice Hall,2002.

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    [2] ZHAO Youquan, JIANG Lei, HE Feng, ZHAI Ruiwei, LIU Xiao, XU Qiaoyan. Measurement and Analysis of Linear CCD Nonlinear Optical Response Characteristics[J]. Opto-Electronic Engineering, 2015, 42(7): 19

    [3] Wang Jinsong, Zhu Dazhao, Li Yanfeng, An Zhiyong. Measuring Pulsed Laser Beam Divergence Angle Via Dual-Frame Image Fusion[J]. Chinese Journal of Lasers, 2014, 41(7): 708002

    [in Chinese], [in Chinese], [in Chinese]. Extended dynamic-range techniques of CCD measurements[J]. Opto-Electronic Engineering, 2006, 33(10): 96
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