• Laser & Optoelectronics Progress
  • Vol. 55, Issue 6, 061601 (2018)
Chongjin Song1、2、1; 2; , Hongxia Xi1、2、1; 2; , Jun Cao1、2、1; 2; , Haibo Qu1、2、1; 2; , Li Chen1、2、1; 2; , Yan Liu1、2、1; 2; , and Junjie An1、2、1; 2;
Author Affiliations
  • 1 Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2 Key Laboratory of Infrared System Detection and Imaging Technology, Chinese Academy of Sciences,Shanghai 200083, China
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    DOI: 10.3788/LOP55.061601 Cite this Article Set citation alerts
    Chongjin Song, Hongxia Xi, Jun Cao, Haibo Qu, Li Chen, Yan Liu, Junjie An. Influence of Locally Concentrated Stress in Quartz on Precision of Digital Sun Sensors[J]. Laser & Optoelectronics Progress, 2018, 55(6): 061601 Copy Citation Text show less
    Working principle for four-holes APS sun sensor
    Fig. 1. Working principle for four-holes APS sun sensor
    Schematic of optical structure for digital sun sensor
    Fig. 2. Schematic of optical structure for digital sun sensor
    Impact of interference spot on centroid
    Fig. 3. Impact of interference spot on centroid
    Schematic of optical path for quarter-wave plate method
    Fig. 4. Schematic of optical path for quarter-wave plate method
    Stress distribution of different quartz specimens. (a) 1#; (b) 2#; (c) 3#; (d) 4#
    Fig. 5. Stress distribution of different quartz specimens. (a) 1#; (b) 2#; (c) 3#; (d) 4#
    Schematic of calibration system for sun sensor
    Fig. 6. Schematic of calibration system for sun sensor
    Light spot images of different quartz specimens when azimuthal angle is 40° and pitch angle is 10°. (a) 1#; (b) 2#; (c) 3#; (d) 4#
    Fig. 7. Light spot images of different quartz specimens when azimuthal angle is 40° and pitch angle is 10°. (a) 1#; (b) 2#; (c) 3#; (d) 4#
    Light spot images of different quartz specimens when azimuthal angle is 40° and pitch angle is 20°. (a) 1#; (b) 2#; (c) 3#; (d) 4#
    Fig. 8. Light spot images of different quartz specimens when azimuthal angle is 40° and pitch angle is 20°. (a) 1#; (b) 2#; (c) 3#; (d) 4#
    ClassificationBirefringence δn /(nm·cm-1)
    Level Ⅰ≤2
    Level Ⅱ2-6
    Level Ⅲ6-10
    Level Ⅳ10-20
    Level Ⅴ20-50
    Table 1. Levels of stress birefringence of JGS1 quartz materials[5]
    Pitch angle δ /(°)Azimuth angle a /(°)
    939.9179-40.5193
    1039.9000-40.5017
    1139.7906-40.4930
    1239.7902-40.4931
    1339.7988-40.4017
    1439.8163-40.4197
    1539.7422-40.3463
    1639.6770-40.3823
    1739.6208-40.2261
    1839.5737-40.1799
    1939.6369-40.1426
    2039.5069-40.1149
    2139.4875-39.8936
    2239.4775-39.8842
    2339.4771-39.7829
    2439.4864-39.6907
    2539.1983-39.7102
    2639.0214-39.5348
    2738.9564-39.2655
    2838.7978-39.2113
    2938.9595-39.1668
    Table 2. Range of interference spot in full visual field
    Chongjin Song, Hongxia Xi, Jun Cao, Haibo Qu, Li Chen, Yan Liu, Junjie An. Influence of Locally Concentrated Stress in Quartz on Precision of Digital Sun Sensors[J]. Laser & Optoelectronics Progress, 2018, 55(6): 061601
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