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Journals >
Laser & Optoelectronics Progress >
Volume 55 >
Issue 11 >
Page 111102 > Article
Laser & Optoelectronics Progress
Vol. 55, Issue 11, 111102 (2018)
Sensitivity Investigation of Schlieren Imaging System
Wenyue Wang
**
, Ruige Dong, and Wenlong Yang
*
Author Affiliations
College of Science, Harbin University of Science and Technology, Harbin, Heilongjiang 150000, China
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DOI:
10.3788/LOP55.111102
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Wenyue Wang, Ruige Dong, Wenlong Yang. Sensitivity Investigation of Schlieren Imaging System[J]. Laser & Optoelectronics Progress, 2018, 55(11): 111102
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Fig. 1.
Schematic of experimental setup
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Fig. 2.
Light deflection diagram
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Fig. 3.
Image of the light source at the knife edge
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Fig. 4.
Experimental setup
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Fig. 5.
Images with hot air gun disturbance. (a) T=200 ℃; (b) T=300 ℃
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Fig. 6.
Undisturbed image after brightness processing
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Fig. 7.
Disturbed image after brightness processing
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Fig. 8.
Number of stripes with different schlieren lens focal lengths
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Fig. 9.
Simulated images. (a) n=0.6417, f3=200 mm; (b) n=1.000051, f3=200 mm
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Temperature /℃
20
60
130
180
230
Atmospheric
refraction /(mg·kg
-1
)
271.5863
238.9083
43.5403
39.5466
36.1255
Table 1.
Relationship between atmospheric temperature and refraction
Abstract
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Wenyue Wang, Ruige Dong, Wenlong Yang. Sensitivity Investigation of Schlieren Imaging System[J]. Laser & Optoelectronics Progress, 2018, 55(11): 111102
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Paper Information
Category: Imaging Systems
Received: Mar. 27, 2018
Accepted: Jun. 4, 2018
Published Online: Dec. 1, 2018
The Author Email: Wang Wenyue (942330720@qq.com), Yang Wenlong (wlyang@hrbust.edu.cn)
DOI:
10.3788/LOP55.111102
Recommended Topics
laser devices and laser physics
Lasers and Laser Optics
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