Chen Li, Yuxiu Hu, Zongze Wei, Chongjun Wu, Yunfeng Peng, Feihu Zhang, Yanquan Geng. Damage evolution and removal behaviors of GaN crystals involved in double-grits grinding[J]. International Journal of Extreme Manufacturing, 2024, 6(2): 25103

Search by keywords or author
- International Journal of Extreme Manufacturing
- Vol. 6, Issue 2, 25103 (2024)
Abstract

Set citation alerts for the article
Please enter your email address