[1] Hao Lichao, Ding Ruijun, Zhang Junling, et al. A high-performance readout circuit (ROIC) for VLWIR FPAs with novel current mode background suppression[C]//IEEE ICMIC, 2012: 869-873.
[2] Fan Jinxiang, Yang Jianyu. Development trends of infrared imaging detecting technology[J]. Infrared and Laser Engineering, 2012, 41(12): 3145-3153. (in Chinese)
[3] Lai Canxiong, Yang Shaohua, Lu Guoguang. Failure analysis of integrated detector Dewar cryocooler assembly[C]//2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013: 935-938.
[4] Su Yuhui, Gong Xiaoxia, Lei Shengqiong, et al. Discussion of reliability evaluation on infrared photovoltaic detector by noise[J]. Infrared Technology, 2009, 31(9): 509-512. (in Chinese)
[5] Norton P. HgCdTe infrared detector[J]. Opto-Electronics Review, 2002, 10(3): 159-174.
[6] Chen Baoguo, Fan Yangyu, Wang Wei. Research on relations among defective element criterions of IRFPA[J]. Laser and Infrared, 2013, 43(2): 186-189. (in Chinese)
[7] Chen Xing, He Kai, Wang Jianxin, et al. Thermal cycling reliability of linear HgCgTe infrared detectors[J]. J Infrared Millim Waves, 2014, 33(4): 369-374. (in Chinese)
[8] Li Xue, Shao Xiumei, Tang Hengjing, et al. Inoperable pixels of 256×1 element linear InGaAs near-infrared focal plane arrays[J]. J Infrared Millim Waves, 2011, 30(5): 409-411. (in Chinese)
[9] Zhang Liwen, Shao Ming, Zhang Xiaoling, et al. Three-dimensional modeling and simulation of large-format hybrid indium antimonide detector arrays[J]. Optical Engineering, 2013, 52(10): 103110-1-103110-7.
[10] Wang Wei, Fan Yangyu, Si Junjie, et al. Types and determination of bad pixels in IRFPA[J]. Infrared and Laser Engineering, 2012, 41(9): 2261-2264. (in Chinese)
[11] Chen Xing. Research on the related technology of HgCdTe infrared focal plane detector reliability[D]. Beijing: University of Chinese Academy of Sciences, 2014: 48-86. (in Chinese)
[12] Rogalski A. Material considerations for third generation infrared photon detectors[J]. Infrared Physics and Technology, 2007, 50: 240-252.
[13] Stephen P Tobin. Thermal cycling-induced changes in excess dark current in very long-wavelength HgCdTe photodiodes at low temperature[J]. Journal of Electronic Materials, 2006, 35: 1411-1415.
[14] Huang Xi, Zhang Jianqi, Liu Delian. Algorithm of blind pixels adaptive detection and compensation for infrared image[J]. Infrared and Laser Engineering, 2011, 40(2): 370-376. (in Chinese)
[15] Dierickx B, Meynants G. Missing pixel correction algorithm for image sensors [C]//SPIE, 1998, 3410: 200-203.