[1] Jacqueline M R B, Paré J R J[J]. J. Microwave Power EE., 42, 24(2007).

[2] Lester E, Kingman S, Dodds C[J]. Fuel, 84, 423(2005).

[3] Yue S, Zhang Z C, Gao D P[J]. Acta Phys. Sin., 62, 178401(2013).

[4] Yang S H, Liu Y C, Yuan Z Y[J]. CN Patent ZL, 201410193925.2(2014).

[5] Zhang E Q[J]. IEEETrans. Elec. Dev., 27, 1280(1980).

[6] [J]. Magnetron Design Handbook, 193,211,420(1979).

[7] Li SG, Yan T C, Li F L, Yang J S, Shi W[J]. IEEE Trans. Plasma. Sci., 44, 1386(2016).

[8] Huang H P, Huang K M, Liu C J[J]. IEEE Microw Wirel Co., 28, 509(2018).

[9] Buxbaum C, Gessinger G[J]. US Patent, 4083811(1978).

[10] Goebel D M, Hirooka Y, Campbell G A[J]. Rev. Sci. Instrum, 56, 1888(1985).

[11] Frank B, Gartner G[J]. US Patent, 4533852(1985).

[12] Tadashi S, Kiyosaki M[J]. JP Patent, 59179754(1990).

[13] Rao G S, Dharmadhikari C V, Nigavekar A S[J]. J Vac Sci Technol, 7, 3269(1989).

[14] Wang J S, Zhou M L, Ma S Y J, Zuo T Y[J]. J. Alloys Compd., 419, 172(2006).

[15] Zhang J X, Zhou M L, Zhou W Y, Wang J S, Nie Z R, Zuo T Y[J]. Trans: Nonferrous Met. Soc. China, 12, 43(2002).

[16] Nie Z R, Zuo T Y, Zhou M L, Wang Y M, Wang J S[J]. J. Rare Earth, 18, 110(2000).

[17] Bruining D H[J]. Physics and Application of Secondary Electron Emission, 19(1954).

[18] Liu X Q[J]. Cathode Electronics, 95,149,184,211(1980).

[19] Qi S K, Wang X X, Luo J R, Zhao Q L, Li Y[J]. Acta Phys. Sin., 65, 057901(2016).

[20] [J].

[21] Qi S K, Wang X X, Luo J R, Hu M W, Li Y[J]. Proceedings of IRMMW-THz Hong Kong, 12(2015).

[22] Qi S K, Wang X X, Luo J R, Zhao S K, Zhao Q L, Li Y, Zhang Q[J]. Rare Metal Mat. Eng., 473, 784(2018).

[23] Qi S K, Wang X X, Luo J R, Hu M W, Li Y[J]. J. Inorg. Mater., 31, 987(2016).

[24] Hu M W, Wang X X, Qi S K[J]. IEEE Trans. Elec. Dev., 66, 3592(2019).

[25] Wang X X, Liao X H, Luo J R, Zhao Q L, Zhang M, Wang Q F, Li Y[J]. IEEETrans. Elec. Dev., 59, 491(2012).

[26] Chang T J, Qi X[J]. Modern Analysis Methods of Materials, 124,125(1999).