Profilometry for phase measurement with non-integral twin-frequency grating

[in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 33 >Issue 1 >Page 116 > Article

Opto-Electronic Engineering
Vol. 33, Issue 1, 116 (2006)

Profilometry for phase measurement with non-integral twin-frequency grating

[in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese]. Profilometry for phase measurement with non-integral twin-frequency grating[J]. Opto-Electronic Engineering, 2006, 33(1): 116 Copy Citation Text

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References

[1] Frank CHEN,Gordon M BROWN,Munin SONG.Overview of three-dimensional shape measurement using optical methods[J].Opt.Eng,2000,39(1):10-22.

[3] Jielin LI,HongJun SU,Xianyu SU.Two-frequency grating used in phase-measuring profilometry[J].Applied Optics,1997,36(1):277-280.

[5] J.M.HUNTLEY,H.SALDNER.Temporal phase-unwrapping algorithm for automated interferogram analysis[J].Applied Optics,1993,32(17):3047-3052.

[6] V.I.GUSHOV,Yu.N.SOLODKIN.Automatic processing of fringe patterns in integer interferometers[J].Opt.Lasers Eng,1991,14(4-5):311-324.

[7] Yasuyuki IKEDA,Satoru YONEYAMA,Motoharu FUJIGAKI,et al.Absolute phase analysis method for three-dimensional surface profilometry using frequency-modulated grating[J].Opt.Eng,2003,42(5):1249-1256.

[in Chinese], [in Chinese], [in Chinese]. Profilometry for phase measurement with non-integral twin-frequency grating[J]. Opto-Electronic Engineering, 2006, 33(1): 116

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