• Laser & Optoelectronics Progress
  • Vol. 59, Issue 19, 1931003 (2022)
Xingchen Li, Fengyuan Lin*, Huimin Jia, Yubin Kang, Yongji Shi, Bingheng Meng, Dan Fang, Jilong Tang, Dengkui Wang, Kexue Li, Xueying Chu, and Zhipeng Wei
Author Affiliations
  • State Key Laboratory of High Power Seminconductor Laser, College of Science, Changchun University of Science and Technology, Changchun130022, Jinlin, China
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    DOI: 10.3788/LOP202259.1931003 Cite this Article Set citation alerts
    Xingchen Li, Fengyuan Lin, Huimin Jia, Yubin Kang, Yongji Shi, Bingheng Meng, Dan Fang, Jilong Tang, Dengkui Wang, Kexue Li, Xueying Chu, Zhipeng Wei. High Crystallization Quality β-Ga2O3 Films Prepared by Chemical Vapor Deposition[J]. Laser & Optoelectronics Progress, 2022, 59(19): 1931003 Copy Citation Text show less

    Abstract

    In order to obtain high-quality films and reduce experimental costs, β-Ga2O3 films were synthesized on mica substrates by chemical vapor deposition using GaTe powder as the Ga source. High crystalline quality β-Ga2O3 thin films were obtained by changing the growth temperature, buffer gas, and growth time, which were confirmed by X-ray diffraction (XRD) and Raman spectroscopy. XRD results showed that the optimal growth temperature of the film was 750 ℃. A comparison of β-Ga2O3 films synthesized under different buffer gases revealed Ar to be the best environment for growing film materials. The growth time of the thin films was changed under an Ar atmosphere to achieve β-Ga2O3 thin films with high crystalline quality. XRD results showed that the thin film with a growth time of 20 min had high crystalline quality. Finally, it was transferred to a Si/SiO2 substrate with a 300 nm thick oxide layer and tested by atomic force microscopy to obtain a 16 nm thick two-dimensional Ga2O3 film.
    Xingchen Li, Fengyuan Lin, Huimin Jia, Yubin Kang, Yongji Shi, Bingheng Meng, Dan Fang, Jilong Tang, Dengkui Wang, Kexue Li, Xueying Chu, Zhipeng Wei. High Crystallization Quality β-Ga2O3 Films Prepared by Chemical Vapor Deposition[J]. Laser & Optoelectronics Progress, 2022, 59(19): 1931003
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