• Chinese Journal of Quantum Electronics
  • Vol. 20, Issue 6, 749 (2003)
[in Chinese]1、*, [in Chinese]2, and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. High Precision Measurement of F-P Etalon Spacing[J]. Chinese Journal of Quantum Electronics, 2003, 20(6): 749 Copy Citation Text show less

    Abstract

    A high precision measure method of F-P etalon spacing is proposed by measuring the moving number of transmission resonant peak with the incident angle of F-P etalon. The measurement precision of this method shows that the relative error of F-P etalon spacing will be 4×10-4 when precision of angle is 30" and optical spectrum analyzer precision is 2 GHz.
    [in Chinese], [in Chinese], [in Chinese]. High Precision Measurement of F-P Etalon Spacing[J]. Chinese Journal of Quantum Electronics, 2003, 20(6): 749
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