[1] Lin Juan. Interference absolute measurement for homogeneity of large-aperture optical glass［J］. J. Applied Optics, 2008, 29(1): 120～123

[2] Ren Huan, Yuan Jing, Xu Hua et al.. Optical homogeneity measure method analysis of optical material［J］. Optics & Optoelectronic Technology, 2007, 5(6): 48～51

[3] Xu Xinhua, Wang Qing, Song Bo et al.. Measurement system of optical homogeneity of large-size optical material based on subaperture stitching technique［J］. Acta Optica Sinica, 2012, 32(4): 0412002

[4] Xu Jiancheng, Shi Qikai, Chai Liqun et al.. Spatial Fourier fringe analysis with single three-surface interferogram［J］.Chinese J. Lasers, 2006, 33(9): 1260～1264

[5] Chen Lei, Wang Qing, Zhu Rihong. Measurement of the homogeneity of refractive index of the germanium crystal using IR interferometer［J］. Chinese J. Lasers, 2005, 32(3): 404～406

[6] Zhang Jianfeng, Cao Xuedong, Wu Shibin et al.. Temperature effect on high precision measurement of refractive index homogeneity of optical glass［J］. Laser & Optoelectronics Progress, 2012, 49(1): 011203

[7] Guo Peiji, Yu Jingchi et al.. Absolute testing method of the homogeneity of optical glass［J］. Laser Journal, 2003, 24(3): 26～27

[8] L. L. Deck. Fourier-transform phase-shifting interferometry［J］. Appl. Opt., 2003, 42(13): 2354～2365

[9] Peter de Groot. Wavelength-tuned phase shifting interferometry applied to the measurement of transparent plates［C］. Québec City: Optical Fabrication and Testing, 2000. OTuB3

[10] Peter de Groot. Measurement of transparent plates with wavelength-tuned phase-shifting interferometry［J］. Appl. Opt., 2000, 39(16): 2658～2663

[11] K. Hibino, B. F.Oreb, P. S. Fairman. Improved algorithms for wavelength scanning interferometry: application to the simultaneous measurement of surface topography and optical thickness variation in a transparent parallel plate［C］. SPIE, 2002, 4777: 212～219

[12] L. L. Deck. Multiple surface phase shifting interferometry［C］. SPIE, 2001, 4451: 424～431

[13] J. B. Liu, P. D. Ronney. Modified Fourier transform method for interferogram fringe pattern analysis［J］. Appl. Opt., 1997, 36(25): 6231～6241

[14] K. Hibino, B. F. Oreb, P. S.Fairman et al.. Simultaneous measurement of surface shaope and variation in optical thickness of a transparent parallel plate in wavelength-scanning Fizeau interferometer［J］. Appl. Opt., 2004, 43(3): 1241～1249

[15] K. Okada, H. Sakuta, T. Ose et al..Separate measurements of surface shapes and refractive index inhomogeneity of an optical element using tunable-source phase shifting interferometry［J］. Appl. Opt., 1990, 29(22): 3280～3285

[16] Zhu Rihong, Chen Lei, Gao Zhishan et al.. Near infrared large aperture (24 inches) interferometer system development［C］.Fringe 2009 : 6th Internatioanl Workshop on Advanced Optical Metrology, 2009. 705～708

[17] M. Takeda, H. Ina, Kobayashi. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry［J］. J. Opt. Soc. Am., 1982, 72(1): 156～160