• Spectroscopy and Spectral Analysis
  • Vol. 39, Issue 11, 3433 (2019)
CAI Peng-cheng*, LI Shuang, CAI Hong-xing, TAN Yong, SHI Jing, and MIAO Xin-hui
Author Affiliations
  • [in Chinese]
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    DOI: 10.3964/j.issn.1000-0593(2019)11-3433-05 Cite this Article
    CAI Peng-cheng, LI Shuang, CAI Hong-xing, TAN Yong, SHI Jing, MIAO Xin-hui. Study on Measurement of the Damage Threshold of Silicon Nitride Ceramics under Pulsed Laser Irradiation by Spectroscopy[J]. Spectroscopy and Spectral Analysis, 2019, 39(11): 3433 Copy Citation Text show less
    References

    [1] Hou X M, Wang E H, Li B, et al. Ceramics International, 2017, 43(5): 4344.

    [2] Sun Y G, He S L, Liu R A, et al. China Ceramic Industry , 2016, 23: 31.

    [3] Zhang Jingyang, Long Ying, Liao Shixian, et al. Ceramics International, 2017, 43: 2938.

    [4] Kim J D, Lee S J, Suh J. J. Mech. Sci. Technol., 2011, 25(4): 995.

    [5] Poulain G, Blanc D, Focsa A, et al. Energy Procedia, 2012, 27: 516.

    [6] Heinrich G, Wollgarten M, Bahr M, et al. Appl. Surf. Sci., 2013, 278: 265.

    [7] Pan A F, Wang W J, Mei X S, et al. Appl. Surf. Sci., 2016, 375: 90.

    [11] ISO 212154-1 Lasers and Laser-Related Equipment——Test Methods for Laser-Induced Damage Threshold——Part 1: Definitions and General Principles, 2011.

    [12] ISO 212154-2 Lasers and Laser-Related Equipment——Test Methods for Laser-Induced Damage Threshold——Part 2: Threshold Determination, 2011.

    CAI Peng-cheng, LI Shuang, CAI Hong-xing, TAN Yong, SHI Jing, MIAO Xin-hui. Study on Measurement of the Damage Threshold of Silicon Nitride Ceramics under Pulsed Laser Irradiation by Spectroscopy[J]. Spectroscopy and Spectral Analysis, 2019, 39(11): 3433
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